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DTSTART:19700308T020000
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BEGIN:VEVENT
DTSTAMP:20260730T152729Z
LOCATION:DAC Pavilion\, Exhibit Floor
DTSTART;TZID=America/Los_Angeles:20260728T170000
DTEND;TZID=America/Los_Angeles:20260728T180000
UID:dac_DAC 2026_sess295_ENGPOST315@linklings.com
SUMMARY:Accelerating DFT Verification and Enhancing Debuggability Using Ve
 loce-Based Full Chip Gate-Level Emulation
DESCRIPTION:Jaesung Park (Samsung Electronics); Jeongjun Lee (Siemens); Hy
 undon Kim, Kyoungmin Park, Youngsik Kim, Dohyeon Lee, Younghyun Cho, Chang
 kyu Lee, and Byungjik Kim (Samsung Electronics); and Inhwan Kim, Justin Le
 e, and Chanjin Kim (Siemens)\n\nThis paper describes the development of a 
 full-chip gate-level emulation environment that enables DFT verification a
 nd the successful application of Debug STIL vectors generated by the Tesse
 nt DFT tool in the Veloce emulation environment, significantly improving d
 ebuggability and shortening the product verification time.\n\nTopics: AI, 
 Chiplet, Design, EDA, Quantum, Security, Systems\n\n
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